“Crystalline Tester CS1” is an inspection device that observes the distribution of crystal strain caused by stress and residual defects in crystal materials.In a non-contact and non-destructive way, this inspection device can easily observe crystal material that is transparent to visible light (wavelength: 400 to 800nm).
Please use it as a crystallinity tester to diagnose the whole crystal for strain which cannot easily or instantly be seen by visual inspection.
This product is developed and manufactured by our company.
|Materials less effective for measure||・Materials not transparent to visible light: Silicon, GaAs etc. Those without birefringence effect: Sapphire, Ga2O3, etc.|