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Crystalline Tester CS1

Crystalline Tester CS1


“Crystalline Tester CS1” is an inspection device that observes the distribution of crystal strain caused by stress and residual defects in crystal materials.In a non-contact and non-destructive way, this inspection device can easily observe crystal material that is transparent to visible light (wavelength: 400 to 800nm).
Please use it as a crystallinity tester to diagnose the whole crystal for strain which cannot easily or instantly be seen by visual inspection.



Crystalline Tester CS1

Product Features

Product Features
  1. High speed measurement (6 "wafer 90 seconds)
    ・The fastest and easiest observation of residual stress distribution

  2. Depth Direction Crystal Evaluation
    ・As a transmission type Crystal Evaluation Device, it can evaluate not only the surface of the crystal substrate, but also the whole crystal along the Z axis.

  3. Measurement results comparable to X-ray diffraction topography
    ・Higher speed and lower costs obtain similar results

  4. Competitive Pricing
    ・The most cost effective system among Crystal Evaluation Devices
Measurable materials
  1. SiC bulk wafer, and SiC Epi wafer
  2. SiC bulk wafer, and SiC Epi wafer
  3. AlN bulk wafer, and AIN Epi wafer
  4. All birefringent crystals transparent to visible light.
Materials less effective for measure ・Materials not transparent to visible light: Silicon, GaAs etc.　　　Those without birefringence effect: Sapphire, Ga2O3, etc.
CS1画像と目視画像との比較


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Manufacturer


Ceramic Forum Co., Ltd. (Japan)

Ceramic Forum Co., Ltd. (Japan)

This product is developed and manufactured by Ceramic Forum

For any questions or requests regarding our services please feel free to contact us via phone or inquiry form.
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