{"id":1317,"date":"2026-07-10T17:17:16","date_gmt":"2026-07-10T08:17:16","guid":{"rendered":"https:\/\/ceramicforum.co.jp\/?post_type=news&#038;p=1317"},"modified":"2026-07-10T17:17:16","modified_gmt":"2026-07-10T08:17:16","slug":"sandia-national-laboratories-orders-laytecs-epix-wafer-mapping-system","status":"publish","type":"news","link":"https:\/\/ceramicforum.co.jp\/en\/news\/sandia-national-laboratories-orders-laytecs-epix-wafer-mapping-system\/","title":{"rendered":"Sandia National Laboratories Orders LayTec\u2019s EpiX Wafer Mapping System"},"content":{"rendered":"<div style=\"line-height:1.55;\">\n<figure style=\"margin:0 0 24px 0; text-align:center;\">\n    <img decoding=\"async\"\n      src=\"https:\/\/ceramicforum.co.jp\/wp-content\/uploads\/2026\/07\/feature_image01.webp\"\n      alt=\"LayTec EpiX wafer mapping system\"\n      style=\"display:block; width:100%; max-width:760px; height:auto; margin:0 auto;\"\n    \/><br \/>\n  <\/figure>\n<p style=\"margin:0 0 16px 0;\">\n    Sandia National Laboratories in the United States has ordered LayTec\u2019s <strong>EpiX<\/strong> wafer mapping system for the optical characterization of advanced semiconductor materials.\n  <\/p>\n<p style=\"margin:0 0 16px 0;\">\n    The ordered system features a manual-loading configuration customized specifically for research and development applications. By combining White Light Reflectance (WLR) and Photoluminescence (PL) measurements, it enables non-contact evaluation of optical properties across the entire wafer surface.\n  <\/p>\n<figure style=\"margin:24px 0; text-align:center;\">\n    <img decoding=\"async\"\n      src=\"https:\/\/ceramicforum.co.jp\/wp-content\/uploads\/2026\/07\/feature_image02.webp\"\n      alt=\"Manual-loading configuration of LayTec EpiX\"\n      style=\"display:block; width:100%; max-width:680px; height:auto; margin:0 auto;\"\n    \/><br \/>\n  <\/figure>\n<p style=\"margin:20px 0 10px 0;\">\n    <strong>[Key Features and Applications of EpiX]<\/strong>\n  <\/p>\n<ul style=\"margin:0 0 20px 0; padding-left:24px; line-height:1.55;\">\n<li style=\"margin:0 0 8px 0; padding:0;\">\n      <strong>Wide Range of Applications:<\/strong> Optimized for the UV-visible range, the system will support research on AlGaN-based power devices, high-frequency devices, optoelectronic devices, and emerging semiconductor materials.\n    <\/li>\n<li style=\"margin:0 0 8px 0; padding:0;\">\n      <strong>Detailed 2D Mapping:<\/strong> It provides two-dimensional mapping of in-plane distributions in optical and emission properties related to layer thickness and composition.\n    <\/li>\n<li style=\"margin:0 0 8px 0; padding:0;\">\n      <strong>Evaluation of Complex Structures:<\/strong> It enables detailed evaluation of wafer-scale uniformity and local variations, even in complex device structures such as High Electron Mobility Transistors (HEMTs).\n    <\/li>\n<li style=\"margin:0; padding:0;\">\n      <strong>Flexible Modular System:<\/strong> Measurement modules, wavelength ranges, and wafer-loading methods can be configured according to specific requirements, supporting applications from compound-semiconductor research and development to quality control in manufacturing processes.\n    <\/li>\n<\/ul>\n<p style=\"margin:0 0 16px 0;\">\n    Ceramic Forum distributes products from Germany-based LayTec AG, including the EpiX wafer mapper and <em>in-situ<\/em> monitoring systems for MOCVD and MBE growth processes.\n  <\/p>\n<p style=\"margin:0 0 16px 0;\">\n    We propose system configurations tailored to specific applications and measurement requirements for wafer characterization and deposition-process control, with a focus on wide-bandgap semiconductors such as GaN, AlGaN, SiC, and AlN. For inquiries regarding EpiX specifications, measurement modules, supported wafer sizes, or customization options, please contact Ceramic Forum.\n  <\/p>\n<div style=\"margin:28px 0 20px 0; text-align:left;\">\n    <img decoding=\"async\"\n      src=\"https:\/\/ceramicforum.co.jp\/wp-content\/uploads\/2026\/07\/laytec_logo.webp\"\n      alt=\"LayTec logo\"\n      style=\"display:block; width:220px; max-width:45%; height:auto;\"\n    \/>\n  <\/div>\n<p style=\"margin:20px 0 10px 0;\">\n    <strong>Related Links<\/strong>\n  <\/p>\n<ul style=\"margin:0; padding-left:24px; line-height:1.5;\">\n<li style=\"margin:0 0 6px 0; padding:0;\">\n      <a\n        href=\"https:\/\/www.semiconductor-today.com\/news_items\/2026\/jul\/laytec-sandia-090726.shtml\"\n        target=\"_blank\"\n        rel=\"noopener noreferrer\"\n      >Original article on Semiconductor Today<\/a>\n    <\/li>\n<li style=\"margin:0 0 6px 0; padding:0;\">\n      <a href=\"https:\/\/ceramicforum.co.jp\/en\/inspection\/wafer\/\">LayTec EpiX Wafer Mapper Product Page<\/a>\n    <\/li>\n<li style=\"margin:0 0 6px 0; padding:0;\">\n      <a href=\"https:\/\/ceramicforum.co.jp\/en\/inspection\/in-situ\/\">LayTec <em>In-Situ<\/em> Metrology Systems<\/a>\n    <\/li>\n<li style=\"margin:0; padding:0;\">\n      <a href=\"https:\/\/ceramicforum.co.jp\/en\/contact\/\">Contact Us | Ceramic Forum<\/a>\n    <\/li>\n<\/ul>\n<\/div>\n","protected":false},"featured_media":0,"template":"","meta":{"_acf_changed":false,"_locale":"en_US","_original_post":"https:\/\/ceramicforum.co.jp\/?post_type=news&p=1312"},"class_list":["post-1317","news","type-news","status-publish","hentry","en-US"],"acf":[],"_links":{"self":[{"href":"https:\/\/ceramicforum.co.jp\/wp-json\/wp\/v2\/news\/1317","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/ceramicforum.co.jp\/wp-json\/wp\/v2\/news"}],"about":[{"href":"https:\/\/ceramicforum.co.jp\/wp-json\/wp\/v2\/types\/news"}],"version-history":[{"count":7,"href":"https:\/\/ceramicforum.co.jp\/wp-json\/wp\/v2\/news\/1317\/revisions"}],"predecessor-version":[{"id":1333,"href":"https:\/\/ceramicforum.co.jp\/wp-json\/wp\/v2\/news\/1317\/revisions\/1333"}],"wp:attachment":[{"href":"https:\/\/ceramicforum.co.jp\/wp-json\/wp\/v2\/media?parent=1317"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}