{"id":1629,"date":"2026-10-28T11:49:04","date_gmt":"2026-10-28T02:49:04","guid":{"rendered":"https:\/\/ceramicforum.co.jp\/?post_type=news&#038;p=1629"},"modified":"2026-10-28T11:49:04","modified_gmt":"2026-10-28T02:49:04","slug":"iwn2026-kumamoto-exhibition-f03","status":"publish","type":"news","link":"https:\/\/ceramicforum.co.jp\/en\/news\/iwn2026-kumamoto-exhibition-f03\/","title":{"rendered":"Ceramic Forum at IWN2026 in Kumamoto: Booth F03 and CP1 Poster Presentation"},"content":{"rendered":"<figure class=\"wp-block-image\">\n<a href=\"https:\/\/iwn2026.jp\/\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" width=\"2560\" height=\"2560\" class=\"wp-image-1626\" src=\"https:\/\/ceramicforum.co.jp\/wp-content\/uploads\/2026\/10\/4a332f05ade4ac7bb3c46c472cb5eac8.png\" alt=\"Official IWN2026 logo - International Workshop on Nitride Semiconductors 2026\" style=\"display:block;max-width:100%;height:auto;width:440px;margin:0 auto;\" srcset=\"https:\/\/ceramicforum.co.jp\/wp-content\/uploads\/2026\/10\/4a332f05ade4ac7bb3c46c472cb5eac8.png 2560w, https:\/\/ceramicforum.co.jp\/wp-content\/uploads\/2026\/10\/4a332f05ade4ac7bb3c46c472cb5eac8-300x300.png 300w, https:\/\/ceramicforum.co.jp\/wp-content\/uploads\/2026\/10\/4a332f05ade4ac7bb3c46c472cb5eac8-1024x1024.png 1024w, https:\/\/ceramicforum.co.jp\/wp-content\/uploads\/2026\/10\/4a332f05ade4ac7bb3c46c472cb5eac8-150x150.png 150w, https:\/\/ceramicforum.co.jp\/wp-content\/uploads\/2026\/10\/4a332f05ade4ac7bb3c46c472cb5eac8-768x768.png 768w, https:\/\/ceramicforum.co.jp\/wp-content\/uploads\/2026\/10\/4a332f05ade4ac7bb3c46c472cb5eac8-1536x1536.png 1536w, https:\/\/ceramicforum.co.jp\/wp-content\/uploads\/2026\/10\/4a332f05ade4ac7bb3c46c472cb5eac8-2048x2048.png 2048w\" sizes=\"auto, (max-width: 2560px) 100vw, 2560px\" \/><\/a><figcaption>Official IWN2026 logo. Source: <a href=\"https:\/\/iwn2026.jp\/\" target=\"_blank\" rel=\"noopener noreferrer\">IWN2026 official website<\/a><\/figcaption><\/figure>\n<p>Ceramic Forum Co., Ltd. will exhibit at the <strong>International Workshop on Nitride Semiconductors 2026 (IWN2026)<\/strong>, taking place at Kumamoto-jo Hall in Kumamoto, Japan, from <strong>November 8 to 13, 2026<\/strong>. Visit us at <strong>booth F03<\/strong>.<\/p>\n<p>We will introduce products and services supporting nitride semiconductor research and development, including our in-house Crystalline Tester\u00ae CP1 and CS2 crystal defect inspection and evaluation systems, GaN substrates and epitaxial growth services, GaN HEMT epitaxial structures from our partner SweGaN, and DLTS and Hall effect measurement services. Our CTO, Ryo Hattori, will also present a poster on the non-destructive observation of threading dislocations in GaN substrates using CP1.<\/p>\n<h2>Products and services at booth F03<\/h2>\n<h3>Our CP1 and CS2 crystal evaluation systems<\/h3>\n<p><strong><a href=\"https:\/\/ceramicforum.co.jp\/en\/inspection\/cs2\/\">Crystalline Tester\u00ae CP1<\/a><\/strong> is a microscope system for the non-destructive evaluation of crystal defects in wide bandgap semiconductors using phase contrast and polarized-light observation. We will introduce its capabilities for three-dimensional observation and analysis of defects such as threading dislocations inside GaN substrates. <strong><a href=\"https:\/\/ceramicforum.co.jp\/en\/inspection\/cs2\/\">Crystalline Tester\u00ae CS2<\/a><\/strong> is designed for macroscopic assessment of crystal quality. Together, the systems support discussions on material evaluation at both the microscopic and macroscopic levels.<\/p>\n<h3>From GaN materials and epitaxy to contract characterization<\/h3>\n<ul>\n<li><strong>GaN single-crystal substrates and epitaxial growth services:<\/strong> We can discuss material selection and epitaxial structures to suit your research requirements and device designs.<\/li>\n<li><strong>GaN HEMT epitaxial structures from SweGaN:<\/strong> Learn about epitaxial wafers from our partner SweGaN and discuss your application requirements.<\/li>\n<li><strong>DLTS and Hall effect measurement services:<\/strong> Discuss deep-level characterization and electrical property measurements, including carrier concentration and mobility.<\/li>\n<li><strong>Inspection and measurement equipment, and contract crystal evaluation:<\/strong> Explore CP1 and CS2 evaluation services, Phystech DLTS measurement systems, and other characterization technologies for materials and device development.<\/li>\n<\/ul>\n<p>Related information: <a href=\"https:\/\/ceramicforum.co.jp\/en\/inspection\/cs2\/\">CP1 \/ CS2 crystal evaluation systems<\/a> \/ <a href=\"https:\/\/ceramicforum.co.jp\/en\/gan\/\">GaN products and services<\/a> \/ <a href=\"https:\/\/ceramicforum.co.jp\/en\/analysis-service\/\">Analysis services<\/a><\/p>\n<h2>Visit us alongside LayTec and EpiQuest<\/h2>\n<p>Our booth will be located next to LayTec AG and EpiQuest, Inc.<\/p>\n<figure class=\"wp-block-table\" style=\"margin:1.25em 0;overflow-x:auto;\">\n<table style=\"width:100%;border-collapse:collapse;table-layout:auto;\">\n<thead style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;background-color:#f3f5f7;\">\n<tr>\n<th scope=\"col\" style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;background-color:#f3f5f7;width:90px;white-space:nowrap;\">Booth<\/th>\n<th scope=\"col\" style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;background-color:#f3f5f7;\">Exhibitor<\/th>\n<\/tr>\n<\/thead>\n<tbody>\n<tr>\n<td style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;width:90px;white-space:nowrap;\">F02<\/td>\n<td style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;\">LayTec AG<\/td>\n<\/tr>\n<tr>\n<td style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;width:90px;white-space:nowrap;\"><strong>F03<\/strong><\/td>\n<td style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;\"><strong>Ceramic Forum Co., Ltd.<\/strong><\/td>\n<\/tr>\n<tr>\n<td style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;width:90px;white-space:nowrap;\">F04<\/td>\n<td style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;\">EpiQuest, Inc.<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/figure>\n<h2>Late News poster presentation by CTO Ryo Hattori<\/h2>\n<p>The presentation will report <strong>non-destructive, high-resolution three-dimensional observation and analysis of threading dislocations (TDs) in GaN substrates over a wide field of view of 360 \u00b5m \u00d7 300 \u00b5m<\/strong>, using the CP1 phase contrast microscope.<\/p>\n<p>The work includes comparison with multiphoton-excited photoluminescence (MPPL) and experimental results toward the non-destructive detection of pure 1c threading screw dislocations (pure 1c-TSDs). We invite researchers interested in crystal defect observation and evaluation to visit the poster session.<\/p>\n<figure class=\"wp-block-table\" style=\"margin:1.25em 0;overflow-x:auto;\">\n<table style=\"width:100%;border-collapse:collapse;table-layout:auto;min-width:520px;\">\n<tbody>\n<tr>\n<th scope=\"row\" style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;background-color:#f3f5f7;width:170px;\">Format<\/th>\n<td style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;\">Late News poster presentation<\/td>\n<\/tr>\n<tr>\n<th scope=\"row\" style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;background-color:#f3f5f7;width:170px;\">Date and time<\/th>\n<td style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;\">Tuesday, November 10, 2026, 14:45-16:30 (Japan Standard Time)<\/td>\n<\/tr>\n<tr>\n<th scope=\"row\" style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;background-color:#f3f5f7;width:170px;\">Presentation ID<\/th>\n<td style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;\"><strong>TuP-CH-44-LN<\/strong><\/td>\n<\/tr>\n<tr>\n<th scope=\"row\" style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;background-color:#f3f5f7;width:170px;\">Title<\/th>\n<td style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;\">Wide Area Non-destructive Inspection of Threading Dislocations in GaN substrate using Phase Contrast Microscope<\/td>\n<\/tr>\n<tr>\n<th scope=\"row\" style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;background-color:#f3f5f7;width:170px;\">Authors<\/th>\n<td style=\"padding:12px 16px;text-align:left;vertical-align:top;border-bottom:1px solid #d9dfe5;line-height:1.6;\">Ryo Hattori (Ceramic Forum), Yukari Ishikawa and Daiki Katsube (Japan Fine Ceramics Center \/ JFCC)<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/figure>\n<h2>Event details<\/h2>\n<ul>\n<li><strong>Conference:<\/strong> International Workshop on Nitride Semiconductors 2026 (IWN2026)<\/li>\n<li><strong>Dates:<\/strong> November 8-13, 2026<\/li>\n<li><strong>Venue:<\/strong> Kumamoto-jo Hall, Kumamoto, Japan<\/li>\n<li><strong>Our booth:<\/strong> F03<\/li>\n<li><strong>Official website:<\/strong> <a href=\"https:\/\/iwn2026.jp\/\" target=\"_blank\" rel=\"noopener noreferrer\">https:\/\/iwn2026.jp\/<\/a><\/li>\n<li><strong>Program:<\/strong> <a href=\"https:\/\/iwn2026.jp\/program\/programs\/\" target=\"_blank\" rel=\"noopener noreferrer\">IWN2026 Programs<\/a><\/li>\n<\/ul>\n<p>We look forward to discussing your needs in GaN materials sourcing, epitaxy, crystal defect evaluation, and electrical characterization. Please visit <strong>booth F03 and poster TuP-CH-44-LN<\/strong>.<\/p>\n<p>To arrange a meeting during the conference or discuss your requirements in advance, please <a href=\"https:\/\/ceramicforum.co.jp\/en\/contact\/\">contact us<\/a>.<\/p>\n","protected":false},"featured_media":0,"template":"","meta":{"_acf_changed":false,"_locale":"en_US","_original_post":"https:\/\/ceramicforum.co.jp\/?post_type=news&p=1625"},"class_list":["post-1629","news","type-news","status-publish","hentry","en-US"],"acf":[],"_links":{"self":[{"href":"https:\/\/ceramicforum.co.jp\/wp-json\/wp\/v2\/news\/1629","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/ceramicforum.co.jp\/wp-json\/wp\/v2\/news"}],"about":[{"href":"https:\/\/ceramicforum.co.jp\/wp-json\/wp\/v2\/types\/news"}],"version-history":[{"count":2,"href":"https:\/\/ceramicforum.co.jp\/wp-json\/wp\/v2\/news\/1629\/revisions"}],"predecessor-version":[{"id":1631,"href":"https:\/\/ceramicforum.co.jp\/wp-json\/wp\/v2\/news\/1629\/revisions\/1631"}],"wp:attachment":[{"href":"https:\/\/ceramicforum.co.jp\/wp-json\/wp\/v2\/media?parent=1629"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}