Time-Tech Spectra: Perovskite & Semiconductor Optical Inspection Systems
Industrial-Grade Perovskite PV & Semiconductor Inspection Systems
These fully automated inline and offline inspection systems integrate PL (Photoluminescence), EL (Electroluminescence), and AOI imaging.
Utilizing AI, they automatically recognize and classify micro-defects in perovskite layers and tandem cells, tracking them throughout the manufacturing process. Furthermore, advanced features like Pseudo J-V curves, Quasi-Fermi Level Splitting (QFLS), and PLQY imaging enable quantitative, non-destructive evaluation of material performance prior to device fabrication.
Scientific-Grade Spectroscopy Characterization System
A comprehensive spectroscopy system for R&D boasting a maximum spatial resolution of ~260 nm.
By employing Time-Resolved PL (TRPL), it directly visualizes carrier lifetime, mobility, and short-distance migration dynamics at the micro/nano scale. Compatible with low-temperature and high-pressure conditions, it strongly supports the advanced mechanistic analysis of new materials and next-generation devices.
Manufacturer information
Time-Tech Spectra
Established in 2016, Time-Tech Spectra (TTS) leverages proprietary time-resolved spectroscopy technologies to focus on scientific instruments, semiconductor material testing, and photovoltaic cell testing. They provide state-of-the-art inline and offline optical inspection solutions utilizing AI, specifically designed for perovskite solar cells and compound semiconductors, supporting everything from basic research to industrial manufacturing.
