Crystal Evaluation
Ceramic Forum Co., Ltd. offers advanced measurement services using its proprietary 'Crystalline Tester' series (CS2 and CP1). These instruments utilize state-of-the-art technology for defect detection and crystal evaluation in semiconductor materials.
Features of Crystalline Tester CS2
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High throughput defect detection
Equipped with automatic defect classification software for efficient inspection.
Optional automatic wafer loader/unloader enables in-line inspection in production environments.
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High sensitivity detection of impurities and defects
Capable of inspecting in non-polarized, cross-polarized, parallel-polarized, and circular-polarized modes.
Detects even the finest defects within the crystal structure with high sensitivity.
Features of Crystalline Tester CP1
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3D inspection using phase contrast microscopy
Non-destructive 3D mapping of internal crystal defects.
Especially effective at detecting micro-defects and fine surface distortions.
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Automatic defect classification
Automatic defect classification software enables for efficient and accurate evaluation.
Routine inspections can be performed based on specific procedures.
Overview of Services
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Measurement Principle
Combines transmission polarization with phase contrast microscopy for non-destructive detection of crystal defects.
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Compatible Materials
Wide bandgap semiconductors such as SiC, GaN, and AlN.
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Data Analysis and Reporting
Provides detailed analysis of measurement results with user-friendly reporting.
