Analysis Service

Deep Level Transient Spectroscopy (DLTS)
The properties of semiconductor materials are highly sensitive to minute impurities and crystal defects. Therefore, accurate evaluation of these factors is crucial.
DLTS is an advanced technique that enables high-sensitivity detection of deep-level electronic states caused by such crystal defects. Since its development in 1974 by Lang at Bell Labs in the U.S., it has become a widely used method for material analysis.

Ceramic Forum offers advanced measurement services using its proprietary "Crystalline Tester" series (CS2 and CP1). These cutting-edge systems are designed to detect defects and evaluate crystal quality in semiconductor materials with exceptional accuracy.

We offer contract evaluation and analysis of semiconductor material properties.
The Hall Effect measurement is a fundamental technique used to assess key characteristics such as conductivity type, carrier concentration, and mobility.