Ceramic Forum at IWN2026 in Kumamoto: Booth F03 and CP1 Poster Presentation
Ceramic Forum Co., Ltd. will exhibit at the International Workshop on Nitride Semiconductors 2026 (IWN2026), taking place at Kumamoto-jo Hall in Kumamoto, Japan, from November 8 to 13, 2026. Visit us at booth F03.
We will introduce products and services supporting nitride semiconductor research and development, including our in-house Crystalline Tester® CP1 and CS2 crystal defect inspection and evaluation systems, GaN substrates and epitaxial growth services, GaN HEMT epitaxial structures from our partner SweGaN, and DLTS and Hall effect measurement services. Our CTO, Ryo Hattori, will also present a poster on the non-destructive observation of threading dislocations in GaN substrates using CP1.
Products and services at booth F03
Our CP1 and CS2 crystal evaluation systems
Crystalline Tester® CP1 is a microscope system for the non-destructive evaluation of crystal defects in wide bandgap semiconductors using phase contrast and polarized-light observation. We will introduce its capabilities for three-dimensional observation and analysis of defects such as threading dislocations inside GaN substrates. Crystalline Tester® CS2 is designed for macroscopic assessment of crystal quality. Together, the systems support discussions on material evaluation at both the microscopic and macroscopic levels.
From GaN materials and epitaxy to contract characterization
- GaN single-crystal substrates and epitaxial growth services: We can discuss material selection and epitaxial structures to suit your research requirements and device designs.
- GaN HEMT epitaxial structures from SweGaN: Learn about epitaxial wafers from our partner SweGaN and discuss your application requirements.
- DLTS and Hall effect measurement services: Discuss deep-level characterization and electrical property measurements, including carrier concentration and mobility.
- Inspection and measurement equipment, and contract crystal evaluation: Explore CP1 and CS2 evaluation services, Phystech DLTS measurement systems, and other characterization technologies for materials and device development.
Related information: CP1 / CS2 crystal evaluation systems / GaN products and services / Analysis services
Visit us alongside LayTec and EpiQuest
Our booth will be located next to LayTec AG and EpiQuest, Inc.
| Booth | Exhibitor |
|---|---|
| F02 | LayTec AG |
| F03 | Ceramic Forum Co., Ltd. |
| F04 | EpiQuest, Inc. |
Late News poster presentation by CTO Ryo Hattori
The presentation will report non-destructive, high-resolution three-dimensional observation and analysis of threading dislocations (TDs) in GaN substrates over a wide field of view of 360 µm × 300 µm, using the CP1 phase contrast microscope.
The work includes comparison with multiphoton-excited photoluminescence (MPPL) and experimental results toward the non-destructive detection of pure 1c threading screw dislocations (pure 1c-TSDs). We invite researchers interested in crystal defect observation and evaluation to visit the poster session.
| Format | Late News poster presentation |
|---|---|
| Date and time | Tuesday, November 10, 2026, 14:45-16:30 (Japan Standard Time) |
| Presentation ID | TuP-CH-44-LN |
| Title | Wide Area Non-destructive Inspection of Threading Dislocations in GaN substrate using Phase Contrast Microscope |
| Authors | Ryo Hattori (Ceramic Forum), Yukari Ishikawa and Daiki Katsube (Japan Fine Ceramics Center / JFCC) |
Event details
- Conference: International Workshop on Nitride Semiconductors 2026 (IWN2026)
- Dates: November 8-13, 2026
- Venue: Kumamoto-jo Hall, Kumamoto, Japan
- Our booth: F03
- Official website: https://iwn2026.jp/
- Program: IWN2026 Programs
We look forward to discussing your needs in GaN materials sourcing, epitaxy, crystal defect evaluation, and electrical characterization. Please visit booth F03 and poster TuP-CH-44-LN.
To arrange a meeting during the conference or discuss your requirements in advance, please contact us.
